题目： How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range (IEEE Distinguished Talk)

时间：2024年4月11日（星期四），下午3：00

地点：浙江大学玉泉校区行政楼108

报告人： Dr. Benoit Derat (Senior Director for Systems Developments, Rohde & Schwarz, Munich, Germany)

报告内容：

Trends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range length.

报告人简介：

Dr. Benoit Derat received the engineering degree from SUPELEC in 2002 and a Ph.D. degree in physics from University of Paris XI with honors in 2006. From 2002 to 2008, he worked at SAGEM Mobiles as an antenna design and electromagnetics research engineer. In 2009, he founded ART-Fi, which created the first vector-array Specific Absorption Rate measurement system. Dr. Derat operated as the CEO and President of ART-Fi, before joining Rohde & Schwarz in Munich in 2017. He is now working as Senior Director for Systems Developments and Project Implementations, covering Electromagnetic Compatibility, Over-The-Air, and antenna test applications. Dr. Derat is a Senior Member of the Antenna Measurement Techniques Association (AMTA) and the author of more than eighty scientific conference and journal papers, as well as an inventor on more than forty patents, with the main focus in antenna systems near- and far-field characterization techniques.