Recently, Professor Er-Ping Li, Foreign Member of the Chinese Academy of Engineering, was featured in IEEE Electromagnetic Compatibility Magazine. The article, written by IEEE Fellow James Drewniak, Emeritus Professor of the EMC Laboratory at Missouri University of Science and Technology, highlights Professor Li’s academic contributions and international impact in the field of electromagnetic compatibility (EMC).

Link: https://ieeexplore.ieee.org/document/11435335/authors
